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DEEPSOUND DOCS
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PAUT Equipment Comparison

Section titled “PAUT Equipment Comparison”

Test Sample Overview

Section titled “Test Sample Overview”
  • Using a test block with holes drilled at varying sizes, we compared the resulting defect shapes when measured with the Phased Array Ultrasonic Testing (PAUT) systems of both the third-party equipment and the DEEPSOUND device.

Test Sample Overview

Probe & Wedge Information

Section titled “Probe & Wedge Information”

small-image Probe & Wedge Information

  • The specifications and configuration settings for the Probe and Wedge are established as follows:

  • Probe Specifications

    • Frequency: 10 MHz
    • Elements: 16 El
    • Pitch: 0.6 mm

  • Wedge Specifications

    • Wedge Angle: 38 degrees
    • Wedge Velocity: 2337 m/s
    • Height of First Element: 6.08 mm
    • Primary First Element Offset:
      • Third-Party > -23.14 mm / DEEPSOUND > 2.36 mm (Note: Adjusted according to each manufacturer’s respective standards)
    • Wedge Height: 15.00 mm
    • Wedge Length: 25.50 mm
    • Wedge Width: 30.00 mm

Sectorial Scan: Settings & Image Comparison

Section titled “Sectorial Scan: Settings & Image Comparison”

Sectorial Scan Settings

Section titled “Sectorial Scan Settings”
  • The Sectorial Scan parameter values for both the third-party equipment and the DEEPSOUND device were configured as outlined below:

Sectorial Scan Settings

Sectorial Image Comparison

Section titled “Sectorial Image Comparison”
  • A direct visual comparison of the S-scan defect measurement images generated by the third-party equipment and the DEEPSOUND device.

Sectorial Image Comparison

DEEPSOUND                                                        Third-Party Equipment

Collected Sectorial Images

Section titled “Collected Sectorial Images”
  • A side-by-side comparison of the C-scan defect measurement images obtained from both the third-party equipment and the DEEPSOUND device.

DEEPSOUND Sectorial

  • DEEPSOUND

Third-Party Sectorial

  • Third-Party Equipment

Linear Scan: Settings & Image Comparison

Section titled “Linear Scan: Settings & Image Comparison”

Linear Scan Settings

Section titled “Linear Scan Settings”
  • The Linear Scan parameter values for both the third-party equipment and the DEEPSOUND device were configured as detailed below:

Linear Scan Settings

Linear Image Comparison

Section titled “Linear Image Comparison”
  • A direct visual comparison of the S-scan defect measurement images generated by the third-party equipment and the DEEPSOUND device.

Linear Image Comparison

Collected Linear Images

Section titled “Collected Linear Images”
  • A side-by-side comparison of the C-scan defect measurement images obtained from both the third-party equipment and the DEEPSOUND device.

DEEPSOUND Linear

  • DEEPSOUND

Third-Party Linear

  • Third-Party Equipment

Conclusion

Section titled “Conclusion”
  • Both the DEEPSOUND and the third-party equipment were used to systematically inspect the prepared test sample under identical parameter settings.
  • Both systems successfully produced highly comparable sectorial and linear scan images, resulting in consistent data outputs.
  • The initial expectation was for the S-scan images to display the entire lateral profile of the defects; however, the resulting images predominantly highlighted the top edges of the flaws.
  • The linear scan images proved more effective at clearly illustrating the widest cross-section of the sample.